JPH0471161B2 - - Google Patents
Info
- Publication number
- JPH0471161B2 JPH0471161B2 JP63169010A JP16901088A JPH0471161B2 JP H0471161 B2 JPH0471161 B2 JP H0471161B2 JP 63169010 A JP63169010 A JP 63169010A JP 16901088 A JP16901088 A JP 16901088A JP H0471161 B2 JPH0471161 B2 JP H0471161B2
- Authority
- JP
- Japan
- Prior art keywords
- pitch
- diffracted light
- width
- light
- average
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16901088A JPS6426102A (en) | 1988-07-08 | 1988-07-08 | Shape measuring instrument |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16901088A JPS6426102A (en) | 1988-07-08 | 1988-07-08 | Shape measuring instrument |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6426102A JPS6426102A (en) | 1989-01-27 |
JPH0471161B2 true JPH0471161B2 (en]) | 1992-11-13 |
Family
ID=15878662
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16901088A Granted JPS6426102A (en) | 1988-07-08 | 1988-07-08 | Shape measuring instrument |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6426102A (en]) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE516501C2 (sv) * | 2000-05-18 | 2002-01-22 | Sandvik Ab | Verktygskoppling |
JP4586260B2 (ja) * | 2000-11-14 | 2010-11-24 | 富士電機デバイステクノロジー株式会社 | ディスクリート・トラック方式の磁気記憶媒体の表面欠陥検査方法 |
EP1965383A1 (en) * | 2007-03-02 | 2008-09-03 | Singulus Mastering B.V. | Diffraction order measurement |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4200396A (en) * | 1977-12-19 | 1980-04-29 | Rca Corporation | Optically testing the lateral dimensions of a pattern |
-
1988
- 1988-07-08 JP JP16901088A patent/JPS6426102A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6426102A (en) | 1989-01-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3741472B2 (ja) | 大等価波長を用いた物体表面形状測定方法及びシステム | |
US20080174785A1 (en) | Apparatus for the contact-less, interferometric determination of surface height profiles and depth scattering profiles | |
KR20120099504A (ko) | 표면 형상 측정 방법 및 표면 형상 측정 장치 | |
JPS6324115A (ja) | 磁気ヘツドの浮上量測定方法及びその装置 | |
JP3511097B2 (ja) | 光干渉を用いた形状測定方法および形状測定装置 | |
US7724375B1 (en) | Method and apparatus for increasing metrology or inspection tool throughput | |
JPH1096611A (ja) | 形状測定装置 | |
JPS6244203B2 (en]) | ||
JP2006250826A (ja) | 計測素子、加工装置および計測方法、屈折率の計測素子 | |
JP2533514B2 (ja) | 凹部深さ・膜厚測定装置 | |
JPH059723B2 (en]) | ||
JPH0471161B2 (en]) | ||
JP2810121B2 (ja) | 光ディスク用スタンパー検査装置 | |
JP2022162306A (ja) | 表面形状計測装置および表面形状計測方法 | |
JPH047803B2 (en]) | ||
JPH01235807A (ja) | 深さ測定装置 | |
Abou-Zeid et al. | Interferometer with a wavelength-tuned diode laser for surface profilometry | |
JPH0566522B2 (en]) | ||
JP2541197Y2 (ja) | 干渉形状測定器 | |
JPS632324B2 (en]) | ||
JPS5813842B2 (ja) | 厚み測定装置 | |
JPS6033003A (ja) | 形状測定装置 | |
JPH0815148B2 (ja) | 食刻深さ測定方法 | |
JP2510418B2 (ja) | ビ−ム走査型干渉法膜厚測定装置 | |
JPH09203615A (ja) | 深さ測定方法及び装置 |